The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Mar. 27, 2013
Applicant:
Siemens Aktiengesellschaft, Munich, DE;
Inventor:
Boris Stowasser, Erlangen, DE;
Assignee:
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20012 (2013.01); G06T 2207/20016 (2013.01);
Abstract
A method for reducing artifacts produced by x-ray radiation directly striking a measuring pixel of a CMOS detector after crossing a scintillator, wherein, for an x-ray image recorded using the CMOS detector, artifact image points are extracted by applying a local, edge-obtaining smoothing operator that evaluates image data of neighboring image points located in the vicinity of a considered image point and comparison with the image to which the smoothing operator was applied, and their image data is corrected.