The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

May. 13, 2010
Applicants:

Yoshihiko Iwase, Yokohama, JP;

Hiroshi Imamura, Tokyo, JP;

Daisuke Furukawa, Koganei, JP;

Inventors:

Yoshihiko Iwase, Yokohama, JP;

Hiroshi Imamura, Tokyo, JP;

Daisuke Furukawa, Koganei, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 7/60 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/0083 (2013.01); G06T 7/602 (2013.01); G01N 21/4795 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01);
Abstract

An image processing apparatus, which analyzes retina layers of an eye to be examined, comprising, means for extracting a feature amount, which represents an anatomical feature in the eye to be examined, from a projection image obtained from a tomogram of the retina layers and a fundus image of the eye to be examined, means for determining a type of the anatomical feature based on the feature amount, means for deciding layers to be detected from the retina layers according to the determined type of the anatomical feature, and detecting structures of the decided layers in the tomogram, and means for modifying the structure of the layer included in a region having the anatomical feature of the structures of the layers detected by the layer structure detection means.


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