The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Sep. 10, 2015
International Business Machines Corporation, Armonk, NY (US);
Gary Israel Givental, Royal Oak, MI (US);
HuyAnh Dinh Ngo, Windsor, CA;
Michael John Suzio, Royal Oak, MI (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An event retrieval and analysis system compares counts of event data for a device to stored profile counts to determine if alerts should be triggered. Event data can be retrieved by a sensor. Rules for analyzing the event data can be retrieved based on the device. The event data is analyzed based on the rules to determine recordable events. Recordable events are organized into categories representing a type or severity of attack. Current event counts are calculated by summing the recordable events for each category. A normal profile is retrieved for the device and compared to the current event count. A percentage change trigger can be retrieved from a threshold matrix based on the current event count. The percentage increase of the current event count over the normal profile is calculated and compared to the percentage change trigger to determine if an alert is triggered by the analysis system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile