The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Mar. 27, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Matthew J. Duftler, Mahopac, NY (US);

Jianying Hu, Bronx, NY (US);

Geetika T. Lakshmanan, Winchester, MA (US);

Szabolcs Rozsnyai, New York, NY (US);

Fei Wang, Ossining, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06G 7/48 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G06F 19/3437 (2013.01); G06F 19/3443 (2013.01);
Abstract

Systems and methods for data analysis include constructing patient traces as a set of medical events for each patient of a patient population, the patient population being segmented based on patient outcomes. Medical events in one or more of the patient traces are reduced to provide processed patient traces. The processed patient traces are clustered to identify a cluster of patient traces. A process model is mined, using a processor, representing an aggregation of treatment pathways in the patient traces from the cluster. Patterns from patient traces are identified that are discriminative of patient outcomes. At least one of the patterns is represented with respect to the process model to identify treatment pathways correlated with the patient outcomes.


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