The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Dec. 23, 2011
Chih-kuang Chang, New Taipei, TW;
Zhong-kui Yuan, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Dong-hai LI, Shenzhen, CN;
Xiao-guang Xue, Shenzhen, CN;
Chih-Kuang Chang, New Taipei, TW;
Zhong-Kui Yuan, Shenzhen, CN;
Li Jiang, Shenzhen, CN;
Dong-Hai Li, Shenzhen, CN;
Xiao-Guang Xue, Shenzhen, CN;
Zijilai Innovative Services Co., Ltd., Shenzhen, CN;
Abstract
A scanner obtains point-cloud data of adjoining parts of a product. A computing device reads two point-clouds from the point-cloud data, fits two or more lines according to the two point-clouds, selects two lines that have the same ascending direction from the two or more lines, and creates a two-dimensional coordinates system base on the two selected lines. The computing device determines a highest point in each of the two point-clouds based on distances from each point in either of the point-clouds to a corresponding selected line, and determines two nearest points in the two point-clouds. A difference between Y coordinates of the two highest points is determined as a gap-height of two adjoining parts of the product, and a difference between X coordinates of the two nearest points is determined as a gap-width between two adjoining parts.