The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Jan. 21, 2015
Optima Design Automation Ltd, Nazareth, IL;
Jamil Raja Mazzawi, Nazareth, IL;
Ayman Kamil Mouallem, Mi'ilya, IL;
OPTIMA DESIGN AUTOMATION LTD, Nazareth, IL;
Abstract
A method, system and product for determining error infliction probability or probability. The method comprises obtaining a representation of a circuit, wherein the circuit comprises nodes, wherein the nodes comprise at least one critical node; obtaining a trace, wherein the trace comprises recorded values of the nodes in a plurality of cycles; determining, by a processor, a Soft Error Infliction Probability (SEIP) of a node, wherein the SEIP is a value representing a probability that a Single Event Upset (SEU) effecting the node in a cycle will inflict a soft error by propagating through the circuit to the at least one critical node, wherein said determining comprises simulating a propagation of the SEU from the cycle to consecutive cycles, wherein said simulating utilizes values from the trace which are associated with the consecutive cycles; and outputting the SEIP of the node.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile