The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Apr. 18, 2011
Rajan Padmanabhan, Phoenix, AZ (US);
Asha Uday Patki, Phoenix, AZ (US);
Rajan Padmanabhan, Phoenix, AZ (US);
Asha Uday Patki, Phoenix, AZ (US);
Infosys Limited, Bangalore, IN;
Abstract
Systems, apparatus, computer-readable storage media, and methods are disclosed for allowing analysis, migration, and validation of data from a source environment (such as an RDBMS system) to a target environment (such as a data warehouse (DW) appliance). In one example, a method comprises analyzing a source database, a source ETL environment, a target database, and a target ETL environment to produce configuration data, the configuration data being used for generating a mapping of the source database to a target database in the target database environment, a mapping of the source DDL code to target DDL code in the target database environment, and a mapping of source ETL code to target ETL code for the target database environment, and migrating at least one table from the source database, at least a portion of the source DDL code, and at least a portion of the source ETL code to the target database environment, where the migrating is based at least in part on the mapping generated using the configuration data.