The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Apr. 04, 2013
Applicant:

Datacolor, Inc., Lawrenceville, NJ (US);

Inventors:

Hong Wei, Lawrenceville, NJ (US);

Michael H. Brill, Kingston, NJ (US);

Assignee:

DATACOLOR HOLDING AG, Luzern, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/34 (2006.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 5/201 (2013.01); G02B 21/34 (2013.01); G02B 21/365 (2013.01);
Abstract

A system and method are disclosed for correcting the color of microscope images for different illuminants. The system includes a microscope having at least one image setting value selector with a plurality of pre-set positions, and an optical train having a distal end and a proximal end and being configured to convey illumination. The optical train is further configured to allow introduction of a calibration slide into the optical train of the microscope at a plurality of possible positions, each position being a conjugate plane of the sample plane, when the sample is in focus. The calibration slide incorporates an integral transmission filter array of known transmission values.


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