The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Sep. 23, 2013
Applicant:
Vista Clara Inc., Mukilteo, WA (US);
Inventors:
David O. Walsh, Mukilteo, WA (US);
Elliot D. Grunewald, Seattle, WA (US);
Hong Zhang, Kenmore, WA (US);
Assignee:
VISTA CLARA INC., Mukilteo, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/14 (2006.01); G01N 24/08 (2006.01); G01R 33/38 (2006.01);
U.S. Cl.
CPC ...
G01V 3/14 (2013.01); G01N 24/081 (2013.01); G01R 33/3808 (2013.01);
Abstract
Technologies applicable to surface-based NMR measurement are disclosed. A surface probe is positionable at or above a surface of the Earth and adapted to make NMR measurements of shallow or very shallow subsurface volumes. NMR spectrometer components connected to the surface probe are configured to control electromagnetic pulses produced by the surface probe and to record resulting detected NMR signals from the subsurface volume.