The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

May. 18, 2012
Applicants:

Weiqi Ding, Fremont, CA (US);

Sergey Shumarayev, Los Altos Hills, CA (US);

Inventors:

Weiqi Ding, Fremont, CA (US);

Sergey Shumarayev, Los Altos Hills, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/319 (2006.01); G01R 31/40 (2014.01);
U.S. Cl.
CPC ...
G01R 31/31924 (2013.01); G01R 31/40 (2013.01);
Abstract

An analog test network includes a conductor. The conductor is coupled to provide a first analog signal from a circuit under test to an analog-to-digital converter circuit. The analog-to-digital converter circuit is operable to generate a first digital signal based on the first analog signal. A control circuit is operable to generate a second digital signal based on the first digital signal. A digital-to-analog converter circuit is operable to generate a second analog signal based on the second digital signal. The conductor is coupled to provide the second analog signal from the digital-to-analog converter circuit to the circuit under test.


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