The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Jul. 12, 2011
Bernhard Bachmann, Bielefeld, DE;
Rainer Ueckerdt, Berlin, DE;
Hermann Penner, Bielefeld, DE;
Dieter Becker, Georgsmarienhuette, DE;
Stefan Rodewald, Bielefeld, DE;
Christian Elsner, Leopoldshoehe, DE;
Bernhard Bachmann, Bielefeld, DE;
Rainer Ueckerdt, Berlin, DE;
Hermann Penner, Bielefeld, DE;
Dieter Becker, Georgsmarienhuette, DE;
Stefan Rodewald, Bielefeld, DE;
Christian Elsner, Leopoldshoehe, DE;
Mitsubishi HiTec Paper Europe GmbH, Flensburg, DE;
Abstract
A method for the production and/or processing of a web-shaped material, particularly paper, with at least one measuring system which records m measurement values yper measurement position over at least a portion of the width s of the web-shaped material at n different measurement positions within a fixed time interval Δt. The method is characterized in that the method includes determining a rational quality number Q, the value of which for a quality of the web-shaped material that is considered acceptable lies within an acceptance range which is to be empirically determined for the production process and which has a lower limit U and an upper limit O, where U and O are in each case rational numbers.