The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Sep. 28, 2012
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Takashi Sumiyoshi, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Segments into which time is divided are set at a point where predicted elution time ranges of compounds in a compound table do not overlap. One or more compounds are allotted to each segment. Subsequently, the dwell time per ion is calculated in each segment, based on the number of assigned compounds, loop time and the like. If the dwell time is shorter than the lower limit value (No in S), the one segment is forcedly subdivided such that each subdivision include a predetermined number of compounds (S). A compound having an elution time range trespassing the new segment boundary is allotted as a measurement target to both segments across the boundary (S). If the dwell time is of at least the lower limit in every segment regenerated by the subdivision (Yes in S), the process for this segment is finished. Such subdivision and compound reassignment in every segment can automatically create a parameter table for a measurement method capable of achieving high quantitativeness.