The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Jun. 10, 2015
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Gongyu Jiang, Shanghai, CN;

Yupeng Cheng, Shanghai, CN;

Xiaoqiang Zhang, Shanghai, CN;

Wenjian Sun, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/34 (2006.01); H01J 49/40 (2006.01); G01N 27/62 (2006.01); H01J 49/22 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 27/624 (2013.01); H01J 49/004 (2013.01); H01J 49/22 (2013.01);
Abstract

An ion mobility analyzer, combination device thereof, and ion mobility analysis method. The ion mobility analyzer comprises an electrode system that surrounds the analytical space and a power device that attaches to the electrode system an ion mobility electric potential field that moves along one space axis. During the process of analyzing mobility of ions to be measured, by always placing the ions to be measured in the moving ion mobility electric potential field, and keeping the movement direction of the ion mobility electric potential field consistent with the direction of the electric field on the ions to be measured within the ion mobility electric potential field, theoretically a mobility path of an infinite length can be formed so as to distinguish ions having mobility or ion cross sections that have very small differences.


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