The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Mar. 13, 2015
Applicant:

Korea University Research and Business Foundation, Seoul, KR;

Inventors:

Wonshik Choi, Seoul, KR;

Sungsam Kang, Seoul, KR;

Seungwon Jeong, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4795 (2013.01); G01B 9/02032 (2013.01); G01B 9/02091 (2013.01); G01B 2290/65 (2013.01);
Abstract

A device for optical coherence tomography (OCT) is provided. The device includes a light source for generating a sample beam incident on a matter and a reference beam for creating interference with the sample beam; a spatial light modulator enabling a plurality of ramp patterns for controlling an incident angle of the sample beam; and a diffraction grating for transmitting only a first diffraction component of the reference beam; whereby an image of the matter within a medium is captured by generating an interference image formed by the interference between the sample beam and the reference beam.


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