The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Sep. 11, 2015
Lumenis Ltd., Yokneam Ilit, IL;
Arkady Khachaturov, Haifa, IL;
Assaf Preiss, Shimshit, IL;
Tal Waisman, Haifa, IL;
Haim Epshtein, Benyamina, IL;
LUMENIS LTD., Yokneam Ilit, IL;
Abstract
Apparatus is described for determining the optical quality of an optical element, the optical element having proximal and distal end portions. The apparatus also includes at least one non-polarizing beam splitter; at least one polarizing beam splitter; at least a first detector operatively associated with the at least one non-polarizing beam splitter; at least a second detector operatively associated with the at least one polarizing beam splitter. The apparatus includes a mechanism to transmit at least one beam of coherent light energy through the at least one non-polarizing beam splitter and through the at least one polarizing beam splitter, the beam being directed to the proximal and distal end portions of the optical element; the beam of coherent light energy that is reflected from the proximal end portion of the optical element is directed back through the at least one polarizing and the at least one non-polarizing beam splitters to the first detector; the beam that is reflected from the distal end portion of the optical element is directed back through the at least one polarized beam splitter to the second detector; and, the energy level detected by the first and the second detectors provides a measure of optical quality of the optical element.