The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Jan. 27, 2003
Applicants:

Takaaki Nagai, Kobe, JP;

Kazuhiro Yamada, Kobe, JP;

Hiroaki Tobimatsu, Kobe, JP;

Inventors:

Takaaki Nagai, Kobe, JP;

Kazuhiro Yamada, Kobe, JP;

Hiroaki Tobimatsu, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/49 (2006.01); G01N 15/14 (2006.01); G01N 33/00 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1459 (2013.01); G01N 33/49 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1402 (2013.01); G01N 2015/1477 (2013.01); G01N 2015/1486 (2013.01); G01N 2015/1488 (2013.01);
Abstract

Particle analyzers are described that include a cell for receiving a particles-containing liquid; a light source for irradiating light onto the particles-containing liquid; a photo-detector for detecting optical information from particles in the particles-containing liquid and converting the optical information into an electric signal; a temperature sensor for detecting a temperature of the particles-containing liquid; and a signal processing section for calculating an analysis result of the particles on the basis of an output of the photo-detector and an output of the temperature sensor. Particle analysis methods are also described.


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