The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Dec. 17, 2014
Applicant:

Shimadzu Corporation, Kyoto, Kyoto, JP;

Inventor:

Shinichiro Totoki, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 15/0211 (2013.01); G01N 15/1434 (2013.01); G01N 2015/1493 (2013.01);
Abstract

In order for a parallel light beam to enable formation of an image at the center of a photodetectorwithout the use of an actuator for the adjustment by an order of micrometers, a particle size distribution measuring apparatusis provided with: a control unitfor calculating the distribution of particle size; a lenswhich is located between a light source unitand a cell baseand has an entrance planeand an exit planethat is not parallel to the entrance plane; and a lens drive mechanismthat can rotate the lensfor adjusting the optical axis so that the angle at which the parallel light beam enters into the entrance planecan be changed, wherein a detecting surfacefor adjusting the optical axis is formed on a photodetector


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