The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Feb. 07, 2013
Applicant:

Ihi Corporation, Koto-ku, Tokyo, JP;

Inventors:

Michiko Baba, Tokyo, JP;

Kouzou Hasegawa, Tokyo, JP;

Norimasa Taga, Tokyo, JP;

Assignee:

IHI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/12 (2006.01); G01B 3/50 (2006.01); G01B 21/14 (2006.01); G01B 11/12 (2006.01);
U.S. Cl.
CPC ...
G01B 3/50 (2013.01); G01B 5/12 (2013.01); G01B 11/12 (2013.01); G01B 21/14 (2013.01);
Abstract

An inner diameter measuring device () for measuring an inner diameter by inserting an inner diameter measuring unit into an inside of a hollow member to be measured, comprises a supporting shaft () having the inner diameter measuring unit supported at a forward end, and a supporting mechanism unit () for cantilever-supporting the supporting shaft, wherein the supporting mechanism unit has a frame (), a spherical bearing () and a deflection adjusting unit (), wherein the shaft is supported by the frame via the spherical bearing, an end portion () of the supporting shaft is passed through the spherical bearing and is extended, and a position of an end of the end portion in vertical direction is adjusted by the deflection adjusting unit.


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