The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Mar. 20, 2015
Applicants:

General Electric Company, Schenectady, NY (US);

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Guang-Hong Chen, Madison, WI (US);

Jiang Hsieh, Waukesha, WI (US);

Assignees:

General Electic Company, Schenectady, NY (US);

Wisconsin Alumni Foundation, Madison, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); A61B 6/032 (2013.01);
Abstract

An imaging system includes a computed tomography (CT) acquisition unit and at least one processor. The CT acquisition unit includes an X-ray source and a CT detector configured to collect CT imaging data of an object to be imaged. The at least one processor is operably coupled to the CT acquisition unit, and is configured to reconstruct an image using the CT imaging information; extract spatial frequency information from at least a portion of the image, wherein the spatial frequency is defined along a longitudinal direction; and remove a periodically recurring artifact from the at least a portion of the image based on a spatial frequency corresponding to a longitudinal collection periodicity to provide a corrected image.


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