The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9427171 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 30, 2016

Filed:

Feb. 22, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Nadine Gdaniec, Eindhoven, NL;

Holger Eggers, Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/48 (2006.01); G01R 33/565 (2006.01); G01R 33/567 (2006.01); A61B 5/08 (2006.01); A61B 5/00 (2006.01); G01R 33/385 (2006.01); G01R 33/54 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); A61B 5/08 (2013.01); A61B 5/7285 (2013.01); G01R 33/385 (2013.01); G01R 33/4818 (2013.01); G01R 33/546 (2013.01); G01R 33/567 (2013.01); G01R 33/5673 (2013.01); G01R 33/56509 (2013.01); G01R 33/4824 (2013.01); G01R 33/5611 (2013.01);
Abstract

A magnetic resonance image of a subject is generated by acquiring k-space samples by sampling an elliptical central area of k-space, k-space having a plurality of points. Each point is representative of a potential sample. An elliptical peripheral area of k-space which peripheral area surrounds the central area is partially sampled. Respiratory motion of the subject is detected and the magnetic resonance image of the subject is reconstructed using the k-space samples acquired before the detection of respiratory motion.


Find Patent Forward Citations

Gdaniec, Nadine. (2016). Magnetic resonance image reconstruction method with respiratory mot detection during sampling of central and peripheral k-space areas (U.S. Patent No. 9427171). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9427171

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