The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Nov. 25, 2014
Applicant:

James Waller Lambuth Lewis, Tullahoma, TN (US);

Inventor:

James Waller Lambuth Lewis, Tullahoma, TN (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/103 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/14 (2013.01);
Abstract

An ocular system for detecting ocular abnormalities and conditions creates photorefractive digital images of a patient's retinal reflex. The system includes a computer control system, a two-dimensional array of infrared irradiation sources and a digital infrared image sensor. The amount of light provided by the array of irradiation sources is adjusted by the computer so that ocular signals from the image sensor are within a targeted range. Enhanced, adaptive, photorefraction is used to observe and measure the optical effects of Keratoconus. Multiple near infrared (NIR) sources are preferably used with the photorefractive configuration to quantitatively characterize the aberrations of the eye. The infrared light is invisible to a patient and makes the procedure more comfortable than current ocular examinations. A lens system is used to remove any low order aberrations present in the patient's eye and improve the detection sensitivity of the system.


Find Patent Forward Citations

Loading…