The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Apr. 28, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Hirofumi Yoshida, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); G01B 9/0203 (2013.01); G01B 9/02091 (2013.01);
Abstract
An optical tomographic imaging apparatus includes a first lens, an optical path branching unit, a second lens and a scanning unit disposed on an optical path of measurement light with which an object to be examined is irradiated. The second lens and the scanning unit are disposed in such a manner that an angle at which the measurement light scanned by the scanning unit is incident on the optical path branching unit satisfies a wavelength separation characteristic of 90% or higher at a wavelength of observation light of the object to be examined in a wavelength band of the measurement light.