The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Jun. 25, 2013
Applicants:

Ying LI, Richmond Hill, CA;

Xu Gang Zhao, Maple, CA;

Inventors:

Ying Li, Richmond Hill, CA;

Xu Gang Zhao, Maple, CA;

Assignee:

VIXS Sytems Inc., Toronto, CA;

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/12 (2006.01); H04N 11/02 (2006.01); H04N 11/04 (2006.01); H04N 19/124 (2014.01); H04N 19/159 (2014.01); H04N 19/172 (2014.01); H04N 19/14 (2014.01); H04N 19/142 (2014.01); H04N 19/152 (2014.01); H04N 19/177 (2014.01); H04N 19/40 (2014.01); H04N 19/196 (2014.01);
U.S. Cl.
CPC ...
H04N 19/124 (2014.11); H04N 19/14 (2014.11); H04N 19/142 (2014.11); H04N 19/152 (2014.11); H04N 19/159 (2014.11); H04N 19/172 (2014.11); H04N 19/177 (2014.11); H04N 19/198 (2014.11); H04N 19/40 (2014.11);
Abstract

A video processing device includes a complexity estimation module to determine a first sum of variances metric and a first estimated picture encoding cost metric for a first picture of a video stream. The video processing device further includes a scene analysis module to determine a first threshold based on a first statistical feature for sum of variance metrics of a set of one or more pictures preceding the first picture in the video stream and a second threshold based on a second statistical feature for estimated picture encoding cost metrics of the set of one or more pictures. The scene analysis module further is to identify a scene change as occurring at the first picture based on the first sum of variances metric, the first estimated picture encoding cost metric, the first threshold, and the second threshold.


Find Patent Forward Citations

Li, Ying. (2016). Scene change detection using sum of variance and estimated picture encoding cost (U.S. Patent No. 9426475). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9426475

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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