The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Jun. 22, 2012
Applicants:

Laurent Guigues, Brussels, BE;

Michel Samuel, Pulau Batam, ID;

Julien Thollot, Woluwe-Saint-Lambert, BE;

Inventors:

Laurent Guigues, Brussels, BE;

Michel Samuel, Pulau Batam, ID;

Julien Thollot, Woluwe-Saint-Lambert, BE;

Assignee:

SOFTKINETIC SOFTWARE, Brussels, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); G01S 17/89 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0022 (2013.01); G01S 17/89 (2013.01); G06T 5/005 (2013.01); G06T 2207/10028 (2013.01); H04N 2013/0081 (2013.01);
Abstract

Described herein is a method for correcting defective depth values in depth map images. Defective values correspond to 'noisy pixels' located on continuous flat surfaces and interpolated 'flying pixels' located along an edge between a foreground object and a background object. The method comprising the steps of accessing a depth map of a scene which includes the foreground and background objects, detecting and identifying noisy and interpolated depth measurements within the depth map using a method, defining and applying a correction to each of the detected defective noisy and interpolated depth measurements using a specifically defined weighted correction factor. By providing the corrected defective depth values in depth map images, edges are sharpened in depth and continuous surfaces are flattened, enabling higher efficiency and robustness of further image processing.


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