The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Dec. 17, 2013
Applicant:

Research & Business Foundation Sungkyunkwan University, Suwon-si, KR;

Inventors:

Keewon Kwon, Seongnam-si, KR;

Jongmin Baek, Imsil-gun, KR;

Dongjin Seo, Gwangju, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); G11C 13/00 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0064 (2013.01); G11C 13/004 (2013.01); G11C 29/50008 (2013.01); G11C 2013/0054 (2013.01); G11C 2029/0409 (2013.01);
Abstract

Disclosed are a semiconductor memory apparatus, and verify read method and system. The semiconductor memory apparatus includes a memory cell array including a plurality of resistive memory cells; and a control block controlling a resistance state of the memory cell to be discriminated based on a digital code value of at least 2 bits or more reflecting the resistance states of the plurality of resistive memory cells. Therefore, data of the memory is discriminated by analyzing distribution of the digital code values to monitor a characteristic of a current memory cell array and read the data having reliability.


Find Patent Forward Citations

Loading…