The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9424638 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 23, 2016

Filed:

Oct. 10, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jae-Cheol Lee, Seoul, KR;

Kyoung-Gu Woo, Seoul, KR;

Yeong-Kyeong Seong, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/0028 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/30004 (2013.01);
Abstract

An apparatus for analyzing a medical image includes an image receiving unit configured to receive two or more medical images from a medical device; a image registration unit configured to register the two or more received medical images; an overlapped area detecting unit configured to detect overlapped areas in the two or more registered medical images; and a lesion analyzing unit configured to analyze lesions in the two or more registered medical images by employing different analysis techniques in the detected overlapped areas.


Find Patent Forward Citations

Lee, Jae-Cheol. (2016). Apparatus and method for analyzing medical image (U.S. Patent No. 9424638). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9424638

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