The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Dec. 12, 2012
Applicant:
Netapp, Inc., Sunnyvale, CA (US);
Inventors:
Michael N. Condict, Hurdle Mills, NC (US);
Fei Xie, Raleigh, NC (US);
Kishore Kasi Udayashankar, San Mateo, CA (US);
Assignee:
NETAPP, INC., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30303 (2013.01); G06F 17/30156 (2013.01);
Abstract
The techniques introduced herein provide for systems and methods for estimating the effectiveness of utilizing a data deduplication process. More specifically, a content-based sampling approach for data deduplication estimation is described in which a subset of the scanned fingerprints of a dataset are included in a content-based sample that is used to determine an accurate deduplication estimate for a dataset (or volume).