The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Aug. 31, 2012
Applicants:

Andrew Robert Lehane, Milnathort, GB;

Antony Kirkham, Edinburgh, GB;

Inventors:

Andrew Robert Lehane, Milnathort, GB;

Antony Kirkham, Edinburgh, GB;

Assignee:

Keysight Technologies, Inc., Santa Rose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3002 (2013.01); G06F 17/30398 (2013.01); G06F 17/30404 (2013.01);
Abstract

A method for operating a data processing system to extract information from a record is disclosed. The method includes defining a plurality of ALTERNATIVE statements. Each ALTERNATIVE statement includes a label that identifies that ALTERNATIVE statement, a Signature that defines a test that is to be performed on a field in the data record defined by a first window, and a NEXT statement that defines a different ALTERNATIVE statement and a second window for testing by that different ALTERNATIVE statement. In one aspect of the invention, the test includes a regular expression that is to match the field. The method defines a SCHEMA statement that defines a plurality of fields within the record. One of the defined fields includes an offset defining a location in the record, a field name, and a field length. The offset and/or the field length are computed by the data processing system.


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