The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

May. 30, 2014
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Sankaran Sivathanu, Mountain View, CA (US);

Jinpyo Kim, Cupertino, CA (US);

Bing Tsai, Santa Clara, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/34 (2006.01); G06F 11/36 (2006.01); G06F 9/50 (2006.01); G06F 13/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3485 (2013.01); G06F 9/5061 (2013.01); G06F 11/348 (2013.01); G06F 11/3466 (2013.01); G06F 11/3476 (2013.01); G06F 11/3636 (2013.01); G06F 13/14 (2013.01);
Abstract

Systems and techniques are described for analyzing input output I/O traces. One of the techniques includes receiving an I/O trace, the I/O trace identifying a temporal sequence of previously submitted I/O requests; partitioning the I/O trace into a plurality of partitions based on a load pattern of the I/O requests in the I/O trace and a data access pattern of the I/O requests in the I/O trace; and generating a signature for each partition, wherein the signature for each of the partitions identifies characteristics of the I/O requests in the partition, and wherein the characteristics of the I/O requests in the partition include the load pattern of the I/O requests in the partition and the data access pattern of the I/O requests in the partition.


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