The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Dec. 08, 2014
Alcatel-lucent Usa, Inc., Murray Hill, NJ (US);
Dan Kushnir, Springfield, NJ (US);
Ahmet Akyamac, Bridgewater, NJ (US);
Veena Mendiratta, Oak Brook, IL (US);
Huseyin Uzunalioglu, Millington, NJ (US);
Derek Doran, Beavercreek, OH (US);
Alcatel Lucent, Boulogne-Billancourt, FR;
Abstract
Various exemplary embodiments relate to a method of determining the root cause of service degradation in a network, the method including determining a window of time; determining one or more abnormal Key Quality Indicators (KQIs) in the window; determining one or more abnormal Key Performance Indicators (KPIs) in the window; calculating a conditional probability that each of one or more KPIs is abnormal when a Key Quality Indicator (KQI) is normal; calculating a conditional probability that the each of one or more KPIs is abnormal when the KQI is abnormal; calculating a score for each KPI based upon a divergence of a Beta distribution for the conditional probability that each of one or more KPIs is abnormal when a KQI is normal and a Beta distribution for the conditional probability that the each of one or more KPIs is abnormal when the KQI is abnormal; and generating a representative root-cause list based upon the score for each KPI.