The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Jul. 08, 2011
William D. Dunfee, Newark, DE (US);
Robert E. Myers, Lewes, DE (US);
Lawrence D. Huppman, Middletown, DE (US);
Nathan A. Small, Bear, DE (US);
John P. Mizzer, Newark, DE (US);
Richard H. Carter, Jr., Merion Station, PA (US);
William D. Dunfee, Newark, DE (US);
Robert E. Myers, Lewes, DE (US);
Lawrence D. Huppman, Middletown, DE (US);
Nathan A. Small, Bear, DE (US);
John P. Mizzer, Newark, DE (US);
Richard H. Carter, Jr., Merion Station, PA (US);
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
Disclosed are systems and apparatus adapted to control a temperature of a process fluid in an instrument. In one aspect, the systems and apparatus are adapted to control fluid temperature provided to a feed tank. The feed tank may feed a metering system and metering line of an instrument such as a clinical analyzer. The fluid temperature control system includes a process fluid inflow, a process fluid outflow, a first fluid path fluidly coupled to the process fluid inflow and outflow, and at least one heat exchanger thermally coupled to the first fluid path, wherein the heat exchanger is adapted to extract heat for at least one heat-generating component of the instrument. Controlling a temperature of the process fluid at the feed tank improves metering accuracy. Methods of operating the system are provided, as are other aspects.