The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Dec. 23, 2009
System, method and computer program for pattern based intelligent control, monitoring and automation
Andrew Wong, Waterloo, CA;
Chung Lam LI, Waterloo, CA;
Andrew Wong, Waterloo, CA;
Chung Lam Li, Waterloo, CA;
Other;
Abstract
The present invention relates to control, monitoring, and automation. The present invention more specifically relates to pattern-based intelligent control, monitoring and automation. The invention performs pattern-based monitoring. It collects signal data from one or more signals. The signal data define signal data streams. It then transforms each of the signal data streams into trends. It also discovers patterns based on the trends within each signal data stream and/or across the signal data streams. The patterns are optionally used for diagnostics and root cause analysis, online plant monitoring and operation control, plant optimization, and other environments where a causal link or correlation may exist between related inputs, states and/or outputs.