The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Nov. 08, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Toshiyuki Yoshida, Yokohama, JP;

Eiichi Hamana, Inagi, JP;

Yasutomo Tsuji, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 27/20 (2006.01); B32B 27/30 (2006.01); G03B 15/16 (2006.01); G03G 15/16 (2006.01);
U.S. Cl.
CPC ...
G03G 15/162 (2013.01); B32B 27/20 (2013.01); B32B 27/308 (2013.01); Y10T 428/31504 (2015.04);
Abstract

The intermediate transfer member is an intermediate transfer member for electrophotography, including a surface layer having a surface for carrying toner, in which: the surface layer contains a fluorine-modified curable resin having one of an acryloyl group and a methacryloyl group, and electro-conductive inorganic particles; and the surface layer has a ratio of the number of atoms of an element derived from the electro-conductive inorganic particles to the total number of atoms to be detected through analysis of the surface by X-ray photoelectron spectroscopy of 2.5 atomic % or more and 10 atomic % or less, and a peak detected at a position corresponding to a mass-to-charge ratio [m/z] of one of m/z=71 and m/z=85 in analysis of the surface by time-of-flight secondary ion mass spectrometry.


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