The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
May. 16, 2014
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventor:
Ki Up Kim, Icheon-si, KR;
Assignee:
SK hynix Inc., Icheon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3187 (2006.01); G11C 29/36 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3187 (2013.01); G11C 29/36 (2013.01); G01R 31/318513 (2013.01); G11C 2029/3602 (2013.01);
Abstract
A test circuit of a semiconductor apparatus includes a plurality of pads, a pattern generator configured to generate at least one internal test pattern in response to at least one pattern select signal, and a plurality of test units configured to transmit the at least one internal test pattern through the plurality of pads in response to a self test mode signal, and to compare the at least one test pattern received via the plurality of pads with the at least one generated internal test pattern and generate at least one test determination value based on the comparison.