The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Apr. 24, 2013
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Edward Vernon Brush, IV, Colorado Springs, CO (US);

Michael T. McTigue, Colorado Springs, CO (US);

Kenneth W. Johnson, Colorado Springs, CO (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 1/067 (2006.01); G01R 1/20 (2006.01); H03K 5/08 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06766 (2013.01); G01R 1/20 (2013.01); G01R 1/06788 (2013.01); H03K 5/08 (2013.01);
Abstract

A probe for a measurement instrument comprises an input terminal configured to receive an input signal from a device under test (DUT), an output terminal configured to transmit an output signal to a measurement instrument, and a clamping circuit disposed in a signal path between the input terminal and the output terminal and configured to clamp an internal probe signal between an upper clamping threshold and a lower clamping threshold to produce the output signal, wherein the clamping circuit operates with substantial gain and amplitude linearity throughout a range between the upper clamping threshold and the lower clamping threshold.


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