The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

May. 15, 2012
Applicant:

Peter G. Panagas, Santa Clara, CA (US);

Inventor:

Peter G. Panagas, Santa Clara, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 31/28 (2006.01); H01L 21/677 (2006.01); G06F 3/044 (2006.01); H04M 1/24 (2006.01); G01R 31/01 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0441 (2013.01); G01R 31/2893 (2013.01); G06F 3/044 (2013.01); H01L 21/67727 (2013.01); H04M 1/24 (2013.01); G01R 31/01 (2013.01); G06F 2203/04103 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A test system may be provided in which devices under test are loaded into test trays and tested at a plurality of test stations. To test a device under test at a given test station, the test tray may be installed into a test fixture at the test station. Test equipment at each test station may communicate with the device under test via the test fixture and the test tray. Each test tray may have a spring-loaded corner portion that may be used to secure the device under test to the test tray. The test tray may have contacts that mate with corresponding contacts at each test fixture and may have a built in cable that connects to the device under test. The test fixture may have a detector that can detect whether or not a test tray is present on the test fixture.


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