The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Aug. 01, 2012
Ian Radley, Durham, GB;
Ben Cantwell, Durham, GB;
David Edward Joyce, Durham, GB;
Paul Scott, Durham, GB;
Ian Radley, Durham, GB;
Ben Cantwell, Durham, GB;
David Edward Joyce, Durham, GB;
Paul Scott, Durham, GB;
Kromek Limited, Sedgefield, GB;
Abstract
A method for monitoring objects for example for facilitating the identification and/or authentication of objects comprises: in a first recording phase: irradiating an object with a suitable source of radiation, collecting intensity information about radiation emergent from the object, resolving the intensity information spectroscopically between at least two energy bands, and storing the resultant dataset as a reference dataset; and in a second verification phase: irradiating an object with a suitable source of radiation, collecting intensity information about radiation emergent from the object, resolving the intensity information spectroscopically between at least two energy bands, and using the resultant dataset as a test dataset; identifying the object and retrieving its corresponding reference dataset; comparing the test dataset and the reference dataset within predetermined tolerance limits, and: in the event that the reference dataset and the test dataset correspond within the predetermined tolerance limits, treating the object as verified or in the event that the reference dataset and the test dataset differ by more than the predetermined tolerance limits, in a third identification phase: numerically processing the resolved intensity information from the test dataset to derive therefrom a dataset of information characteristic of the composition of the object, and using this information to identify the composition of the object.