The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Feb. 06, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Shinji Sakano, Tokyo, JP;

Yuichi Nonaka, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); H04N 5/232 (2006.01); G06T 3/40 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G06T 3/4038 (2013.01); H04N 5/23238 (2013.01); H04N 5/247 (2013.01);
Abstract

A plural camera images capturing and processing apparatus includes a plurality of cameras that capture images of a plurality of adjacent imaging regions which overlap each other, a plurality of laser devices that give a marker to each common imaging region in which imaging regions overlap each other, an imaging control unit that controls each camera and each laser device and acquires a markerless image group to which no marker is given and a marker-given image group to which the marker is given, a non-visible light image processing unit that calculates a correction parameter, which is information for aligning the inclinations, sizes, and positions of the imaging regions, on the basis of the marker-given image group, and a visible light image processing unit that composes the markerless image group to generate a composite image, on the basis of the correction parameter.


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