The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Jun. 12, 2015
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Tamiyo Kobayashi, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 33/68 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/6486 (2013.01); G01N 33/6872 (2013.01); G01N 2021/1787 (2013.01);
Abstract

A method of analyzing an image of a cell in a laminated structure may include the steps of: (a) fluorescently labeling a cell nucleus in the laminated structure having at least one cell layer and one or more other types of biomolecules; (b) acquiring a plurality of planar tomographic fluorescent labeled images in different height directions from the laminated structure for each type of fluorescently labeled biomolecules after the step (a); (c) superimposing a planar tomographic fluorescent labeled image group acquired in the step (b) to construct a three-dimensional tomographic image; (d) dividing the three-dimensional tomographic image constructed in the step (c) into one or two or more cell regions; (e) producing one planar stacked image for each divided cell region after the step (d); and (f) performing image analysis on each planar stacked image produced in the step (e) to analyze cells in the laminated structure.


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