The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Apr. 13, 2011
Applicants:

Norikazu Sugiyama, Hamamatsu, JP;

Takuji Kataoka, Hamamatsu, JP;

Takahiro Ikeda, Hamamatsu, JP;

Inventors:

Norikazu Sugiyama, Hamamatsu, JP;

Takuji Kataoka, Hamamatsu, JP;

Takahiro Ikeda, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); C12Q 1/02 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); C12Q 1/02 (2013.01); G01N 21/253 (2013.01);
Abstract

A membrane potential change detection device is provided with a reflection interference measurement light source, a holder which holds a transparent member on which cells are mounted, a reflection interference detection camera which images light emitted from the reflection interference measurement light source and reflected from the cells through the transparent member, to generate a reflection interference image, and an analysis unit which calculates a parameter dI about adhesion between the cells and the transparent member from the reflection interference image and detects a change of membrane potential of the cells on the basis of a change of the parameter dI.


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