The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Feb. 19, 2015
Hitachi, Ltd., Tokyo, JP;
Shimadzu Corporation, Kyoto, JP;
Hitachi, Ltd, Tokyo, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A strength testing apparatus has a plurality of testing axes, each of which breaks a test piece in a central area thereof. The apparatus has a plurality of 1-axis testing structures each having: an actuator, which is configured to move linearly, thereby to apply a load onto a test body; an actuator fixing base, which is configured to fix the actuator at a predetermined position; a reaction base comprising a chucking tool, which is configured to chuck a test piece, in a chucking tool, which is provided at an end portion of the actuator; and a base, which is configured to connect the actuator fixing base and the reaction base, wherein all of the testing axes, each almost passing through an axial center of each actuator, come across at one (1) point, and the 1-axis testing structures are arranged so that they are included in a same plane.