The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Jun. 03, 2015
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventor:

Eric J. Moy, Orlando, FL (US);

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/00 (2006.01); G01D 18/00 (2006.01); F16C 41/00 (2006.01); G01D 5/244 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G01D 18/008 (2013.01); F16C 41/007 (2013.01); G01D 5/24452 (2013.01); G01D 5/3473 (2013.01);
Abstract

A system and method for determining the angular position of a bearing assembly and compensating measurements for bearing runout error in metrology devices, such as an articulated arm coordinate measurement device and a laser tracker, is provided. The system and method includes measuring the bearing runout error and defining a waveform from encoder readings for a first set of rotations. In one embodiment, a transfer function is created based on an analysis of the bearing runout error, such as with a Fourier analysis for example. In another embodiment the bearing runout error is mapped to an absolute angular position. During operation, the angular position of the bearing assembly is determined by comparing a waveform to the waveform from the first set of rotations. With the angular position determined, the bearing runout error may be used to compensate the measurements of the metrology device.


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