The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Dec. 13, 2012
Honeywell International Inc., Morristown, NJ (US);
Robert H. Fall, St. Petersburg, FL (US);
Barton McJunkin, Redmond, WA (US);
Mitchell Novack, Kenmore, WA (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
Embodiments described herein provide for a method for obtaining an inertial measurement. The method includes obtaining multiple contiguous high sample rate readings during a time period from a conventional inertial sensor. Non-contiguous low sample rate reading of accumulated motion are also obtained over the time period from an atomic inertial sensor. One or more observable errors are estimated for the conventional inertial sensor based on comparing the low sample rate reading to the multiple high sample rate readings. A compensated hybrid reading is determined by compensating the high sample rate readings for the one or more observable errors based on the estimating of the one or more observable errors.