The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Sep. 30, 2013
Applicant:
Board of Regents, the University of Texas System, Austin, TX (US);
Inventors:
Assignee:
Board of Regents, the University of Texas System, Austin, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 1/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); A61B 1/00096 (2013.01); A61B 1/00167 (2013.01); A61B 1/00172 (2013.01); A61B 5/0066 (2013.01); A61B 5/0075 (2013.01); A61B 5/0084 (2013.01); A61B 5/6852 (2013.01); G01B 9/02004 (2013.01); G01B 9/02069 (2013.01); A61B 5/0086 (2013.01); A61B 5/4523 (2013.01); A61B 5/7257 (2013.01); G01B 2290/70 (2013.01);
Abstract
A polarization sensitive spectral interferometer apparatus and method for analyzing a sample by optical energy reflected from the sample. The polarization sensitive spectral interferometer apparatus and method determines polarization properties of the sample by optical energy reflected from the sample. The method for analyzing a sample with a spectral interferometer identifies the tissue type of the sample by the polarization properties as a function of depth from the sample.