The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Mar. 18, 2013
Applicant:

Korloy Inc., Seoul, KR;

Inventors:

Jae-Hoon Kang, Cheongju-si, KR;

Je-Hun Park, Cheongju-si, KR;

Seung-Su Ahn, Cheongju-si, KR;

Sung-Hyun Kim, Cheongju-si, KR;

Jung-Wook Kim, Cheongju-si, KR;

Sung-Gu Lee, Cheongju-si, KR;

Sun-Yong Ahn, Cheongju-si, KR;

Dong-Bok Park, Cheongju-si, KR;

Assignee:

KORLOY INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/06 (2006.01); C23C 30/00 (2006.01); B32B 15/01 (2006.01); C23C 28/02 (2006.01);
U.S. Cl.
CPC ...
C23C 30/005 (2013.01); B32B 15/01 (2013.01); C23C 14/0641 (2013.01); C23C 28/027 (2013.01); Y10T 428/24975 (2015.01); Y10T 428/265 (2015.01);
Abstract

Provided is a hard film for a cutting tool formed on a surface of a base material, the hard film being comprised of a nano multi-layered structure formed by sequentially stacking a thin layer A, a thin layer B, a thin layer C and a thin layer D or being comprised of a structure formed by repeatedly stacking the nano multi-layered structure at least twice, wherein the thin layer A is comprised of TiAlN (0.5≦x≦0.7); the thin layer B is comprised of AlTiMeN (0.4≦y≦0.7, 0<z≦0.1 where Me is at least one of Si, Cr, and Nb); the thin layer C is comprised of AlTiN (0.5≦a≦0.7); and the thin layer D is comprised of AlCrN (0.5≦b≦0.7).


Find Patent Forward Citations

Loading…