The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Jun. 16, 2010
Applicants:

Toshiyuki Tanaka, Nisshin, JP;

Tsuyoshi Hamaguchi, Nagoya, JP;

Takanori Murasaki, Kariya, JP;

Masao Watanabe, Susono, JP;

Daichi Imai, Susono, JP;

Inventors:

Toshiyuki Tanaka, Nisshin, JP;

Tsuyoshi Hamaguchi, Nagoya, JP;

Takanori Murasaki, Kariya, JP;

Masao Watanabe, Susono, JP;

Daichi Imai, Susono, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01J 21/00 (2006.01); B01J 23/00 (2006.01); B01J 25/00 (2006.01); B01J 29/00 (2006.01); B01J 23/10 (2006.01); B01J 35/00 (2006.01); B01D 53/94 (2006.01); B01J 23/34 (2006.01); B01J 23/50 (2006.01); B01J 23/70 (2006.01); B01J 37/02 (2006.01); B01J 21/06 (2006.01);
U.S. Cl.
CPC ...
B01J 35/0073 (2013.01); B01D 53/945 (2013.01); B01J 23/34 (2013.01); B01J 23/50 (2013.01); B01J 23/70 (2013.01); B01J 35/0006 (2013.01); B01J 37/0203 (2013.01); B01J 37/0242 (2013.01); B01D 2255/104 (2013.01); B01D 2255/2092 (2013.01); B01D 2255/20707 (2013.01); B01J 21/063 (2013.01); B01J 21/066 (2013.01); Y02T 10/22 (2013.01);
Abstract

An exhaust gas purifying catalyst includes: a support that contains at least one element that is selected from the first group that consists of Al, Zr and Ce, at least one element that is selected from the second group that consists of Ag, Mn, Co, Cu and Fe, and Ti; and particles that are composed of a metal or oxide of at least one element that is selected from the third group that consists of Ag, Mn, Co, Cu and Fe and that are deposited on the support. Seventy percent or more of any plurality of measurement points with a diameter of 2 nm on a surface of the support are composed of a composite part that has the at least one element selected from the second group content of 0.5 to 10 mol % and has a Ti content of 0.3 mol % or greater.


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