The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Dec. 17, 2008
Applicants:

Ajay Anand, Fishkill, NY (US);

John Petruzzello, Carmel, NY (US);

Inventors:

Ajay Anand, Fishkill, NY (US);

John Petruzzello, Carmel, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/14 (2006.01); A61B 8/08 (2006.01); A61N 7/02 (2006.01); A61B 8/06 (2006.01);
U.S. Cl.
CPC ...
A61B 8/08 (2013.01); A61N 7/02 (2013.01); A61B 8/06 (2013.01); A61B 8/485 (2013.01);
Abstract

The present disclosure provides systems and methods for tracking and guiding high intensity focused ultrasound beams (HIFU). More particularly, the disclosed systems and methods involve use of acoustic radiation force impulse (ARFI) imaging to detect the focal position of an HIFU capable transducer relative to a target area. The focal position may then be 5 compared to a desired treatment location and the orientation and focus of the transducer may be adjusted accordingly so as to reconfigure and/or refocus the HIFU beam relative to the desired treatment location. The desired treatment location may be dynamically determined using bleed detection and localization (BD&L) techniques. Thus, the desired treatment location may be determined using 3D Doppler ultrasound based techniques, wherein changes in quantitative 10 parameters extracted from the Doppler spectra, e.g., Resistance Index (RI), are used to detect and localize a bleeding site for treatment.


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