The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2016
Filed:
Jul. 12, 2013
Hitachi Medical Corporation, Tokyo, JP;
Keisuke Yamakawa, Tokyo, JP;
Shinichi Kojima, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
The present invention is directed to improve the precision of a CT image of a local region (small FOV image) that is obtained by applying the extensive reconstruction technique to the iterative approximate reconstruction method. A first CT image relating to a first reconstruction range is reconstructed from the projection data of a subject, the projection data being detected by the X-ray detector of the X-ray CT apparatus, and the first CT image is corrected iteratively so that the first calculated projection data obtained from the first CT image according to projection calculation, becomes equal to the projection data of the subject. The first CT image thus iteratively corrected is used to extract local measured projection data in association with the second reconstruction range. A second CT image is reconstructed in the second reconstruction range and the second CT image is iteratively corrected so that the extracted local measured projection data becomes equal to the second calculated projection data that is obtained from the second CT image according to the projection calculation.