The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2016

Filed:

Feb. 27, 2014
Applicant:

Optovue, Inc., Fremont, CA (US);

Inventors:

Jay Wei, Fremont, CA (US);

Jing Cui, Fremont, CA (US);

Tao Huang, Fremont, CA (US);

Dragos Stanescu, San Jose, CA (US);

Assignee:

OPTOVUE, INC., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/15 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/152 (2013.01);
Abstract

Embodiments of automatically aligning imager are presented. In accordance with some embodiments, an imaging system includes an adjustment stage; an auto-alignment optics mounted on the adjustment stage and coupled to image an object, the auto-alignment optics including at least one video camera providing an image of the object; imaging scanning optics mounted on the adjustment stage and coupled to scan the object; an imager coupled to the imaging scanning optics; and a processor coupled to the adjustment stage and the auto-alignment optics, the processor executing instructions to receive the image of the object and adjust the adjustment stage to align the optics with the imaging scanning optics.


Find Patent Forward Citations

Loading…