The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Jun. 22, 2007
Applicants:
Praveen Yalagandula, Redwood City, CA (US);
Sujata Banerjee, Palo Alto, CA (US);
Inventors:
Praveen Yalagandula, Redwood City, CA (US);
Sujata Banerjee, Palo Alto, CA (US);
Assignee:
Hewlett Packard Enterprise Development LP, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 40/00 (2009.01); H04W 24/00 (2009.01); H04L 12/701 (2013.01); H04L 12/729 (2013.01); H04L 12/721 (2013.01); H04L 12/26 (2006.01); H04W 40/02 (2009.01);
U.S. Cl.
CPC ...
H04W 40/00 (2013.01); H04L 12/26 (2013.01); H04L 45/00 (2013.01); H04L 45/125 (2013.01); H04L 45/127 (2013.01); H04W 24/00 (2013.01); H04W 40/02 (2013.01);
Abstract
A clustering-based method of estimating a network metric between a first node and a second node includes determining source clusters of nodes and destination clusters of nodes for each node. Cluster heads are selected for each cluster. Measurements of the network metric between each node and each cluster head for the source clusters and destination clusters are performed, and the network metric for a pair of nodes is estimated based on the measurements for the pair of nodes.